Automatic Test Equipment (ATE) systems face constant pressure to deliver higher performance while occupying minimal floor space. In production environments where every rack unit counts and system uptime directly impacts profitability—engineers need solutions that maximize testing capability without compromising operational efficiency.
Our compact, modular 12-slot LXI/USB chassis addresses these critical requirements by delivering high-density switching and simulation in just 2U of rack height. This compact platform enables test engineers to consolidate multiple test functions into a single, manageable unit, while maintaining the flexibility to scale operations as testing demands evolve.
For organizations running 24/7 production test systems, the combination of space efficiency and operational reliability make this chassis an essential component for optimizing ATE performance, reducing cost/slot and maximizing valuable floor space.
Fig. 1: Cost/per slot calculations based on usable slots
The chassis achieves up to 50% rack space reduction compared to traditional solutions. In automotive ECU production lines, this density enables the integration of general-purpose and high-current switching, HIL simulation, and RF switching within a single, compact unit. The consolidation can cut test station footprint requirements by half, while reducing system complexity.
Engineers can scale to 24 slots within 4U by combining two chassis units, providing extensive additional test capability without consuming excessive rack space. This modular approach enables test system architects to right-size their configurations based on specific application requirements.
The chassis supports up to 12 of Pickering’s wide range of over 1,000 3U PXI & PXIe modules, covering switching, simulation, and instrumentation. This extensive compatibility ensures that test engineers can configure systems to meet exact application requirements without being limited by module constraints.
Support includes all Pickering's 2- and 4-slot BRIC matrices, enabling a total of 9,216 crosspoints, programmable resistor modules offering up to 216 channels, RF/microwave & optical switching, and analog & digital instrumentation modules. This breadth of capability enables comprehensive test coverage across various applications.
The fully compliant LXI interface provides 1000BaseT Ethernet connectivity for network-based control architectures. USB 3 compatibility ensures direct PC connection capability, offering flexibility for different system configurations and existing infrastructure requirements.
These dual interfaces enable seamless integration with existing test environments, providing a pathway for future system upgrades without requiring complete infrastructure changes.
The optional sequencing variant offers on-board scan list storage, capable of storing up to 5,000 predefined test sequences. These sequences execute locally within the chassis controller, minimizing the host CPU burden and reducing Ethernet traffic.
For large switching applications, the sequencing capability enables composite switch operations to be grouped together, reducing system switch settling time. For example, operating multiple matrix crosspoints requires only one operation and one delay, rather than individual commands for each crosspoint.
Sixteen software-configurable, bidirectional open-collector triggers enable the management of complex test routines. The triggering system includes dedicated software reset and fault lines, providing comprehensive control over test sequence execution.
The software-configurable nature allows adaptation to different test protocols without hardware modifications.
The removable, modular high-power AC mains supply and embedded controller enable rapid field service without requiring the entire chassis to be removed from the rack. In 24/7 manufacturing environments, components can be swapped between shifts for immediate return to production operations.
This design approach reduces mean time to repair (MTTR) and maximizes system uptime—critical factors in production environments where downtime directly impacts throughput and profitability.
The crossflow cooling system, featuring three 39 CFM fans, provides 25W of cooling capacity per slot at a 40°C ambient temperature. Intelligent fan control automatically adjusts cooling based on thermal load, reducing maintenance requirements while ensuring optimal operating conditions.
The cooling system maintains acoustic emissions at 44 dBA, typical with fans at maximum speed, suitable for laboratory and production environments where noise levels are a concern.
Comprehensive software drivers provide compatibility with LabVIEW, MATLAB, Visual Studio, and Python development environments. This broad support enables integration into existing development workflows without requiring new toolchains or extensive software modifications.
The drivers support kernel-level and IVI/VISA interfaces, providing flexibility for different programming approaches and system architectures. Web-based configuration interfaces enable remote system management and monitoring capabilities.
The standard 3-year warranty, combined with guaranteed long-term support, typically extends 15-20 years beyond the initial purchase date. This commitment ensures that test systems remain operational and supported throughout their intended service life.
Extended warranty and service agreements offer additional support levels for mission-critical applications, where extended uptime requirements require increased service investments.
How does the sequencing capability improve test performance?
The 12-slot LXI/USB modular chassis represents a strategic approach to ATE system optimization, addressing the fundamental challenges of space utilization and operational efficiency. Test engineers can achieve higher performance density by consolidating switching, simulation, and instrumentation functions into a compact, maintainable platform, while reducing system complexity.
For organizations evaluating test system upgrades or facing obsolescence challenges with existing equipment, this chassis provides a pathway to modernize operations without complete system replacement. The combination of proven reliability, comprehensive module support, and long-term support commitment ensures sustainable test system performance for years of operation.