Pickering Interfaces' Blog - Insights into Switching Technology

Automating Test Within Manufacturing Processes - White Paper

Posted by Kelly Porter on Apr 2, 2020 2:29:37 PM

 

whitepaper-cover-automating-test-within-maufacturing-processesIt is best practice when automating test within a manufacturing process to consider interconnection as an extension of the test instrument. In production, the interface between a device under test (DUT) and the test instruments will likely include a network of cabling, a signal distribution or switching subsystem, a connector panel, and device-specific adapters. In essence, all of the cabling, interfacing and switching should now be considered as an extension of the test instrument and must be allowed for when assessing the instrument’s capabilities.

There are always potential issues in production to keep in mind between a device under test (DUT) and the test instruments, focusing on how path resistance, line capacitance and insertion loss affect test results and what can be done to minimize their impact. Signal routing for test would be considered to be perfect if the path between the test instrument and the device under test was electrically ‘invisible’. Of course, this is asking the impossible. This is why test engineers need to take care of the whole measurement channel by considering everything between the instrument and the DUT, including cables, switching subsystems, connectors and mass interconnect products.

Selecting a flexible switching platform that can cover a range of application requirements and provide for future expansion provides a solid foundation for a test system design. You also want to keep in mind that in some cases, cables are supplied with switch modules, so they will have been designed to work with that module. This is why Pickering's modular switching portfolio provides maximum flexibility for system designs. Pickering also has a dedicated facility that produces cables and accessories to ensure that the performance of the switching module is not compromised by poor interconnections. 

Read the entire white paper here to learn more about potential issues in production between a device under test (DUT) and the test instruments, focusing on how path resistance, line capacitance and insertion loss affect test results and what can be done to minimize their impact. 

If you have questions or need more information on automating test within your manufacturing process – please reach out to one of our engineers here.

Topics: PXI, automated test system, test and measurement systems, Device Under Test, DUT, Cables and Connectors